The following sections cover general information about 4pi and the 4pi System.
Read as PDF

• Contacting 4pi Analysis
• Warranty
• Technical Support
• Hardware Description
• Computer Requirements
• Operating System Requirements
• Release Notes
• Reading This Document

The following sections describe the 4pi hardware and installation.

• Introduction
• Theory of Operation
• Unpacking
• Installation

• Introduction
• Theory of Operation
• Unpacking
• Installation

The following sections cover the software install of Revolution and any hardware drivers required.
See the individual links for PDF versions.

The following section is a one-page no-nonsense summary of running Revolution.
No pictures, just the facts. Refer to this if you are already familiar with
the software from previous use, or do not wish to wade through
detailed explanations.

• Install/Upgrade
• Launching
• S(T)EM Images
• Calibrating Micron Marker
• EDX Spectra
• EDX Images (x-ray maps)
• TEM CCD Images
• Quitting
• Movie

The following sections cover the basic operation of Revolution, including starting and
stopping the program, general information, and changing most control parameters.

Read first 5 bullets as PDF
• Launching Revolution 1.5.6
• Version Numbers
• Runtime Notes for 1.5.6
• Quitting Revolution
• Revolution 1.5.6 Preferences

The following sections each describe individual groups of configurable settings. Each section has its own PDF download.

• General
• Scan Generate
• SEM Image
• SEM Linescan
• X-ray Image
• X-ray Probe
• TEM Image
• Micron Marker
• File Formats
• Hardware Setup
• Multi-Toolbar (pdf)

Read first 5 bullets as PDF
• Launching Revolution 1.6.0
• Version Numbers
• Runtime Notes for 1.6.0
• Quitting Revolution
• Revolution 1.6.0 Preferences

The following sections each describe individual groups of configurable settings. Each section has its own PDF download.

• General
• Scan Generate
• SEM Linescan
• Multi-Toolbar (pdf)

The following sections cover the methods of acquiring and displaying SEM images.

• The SEM Image Toolbar
• Previewing Images
• First Run
• Adjusting Resolution and Aspect Ratio
• Adjusting Brightness and Contrast
• Squaring the Pixels
• Initial Scan Adjustment
• Acquiring and Saving Images
• Micron Marker Calibration

• The SEM Image Toolbar
• Previewing Images
• First Run
• Set Scan Controls
• Adjust Resolution (Size) and Aspect Ratio
• Setting the SEM Acquisition Options
• Setting the Image Acquisition Options
• Setting the Line Profile Options
• Setting the Default Save Format
• Adjusting the Brightness and Contrast
• "Squaring" the Pixels
• Scan Adjustment and Artifact Removal
• Acquiring and Saving Images
• Micron Marker Calibration
• Micron Marker Options
• EM Client
• Micron Marker Usage Notes
• Upgrading Micron Marker from v1.5.6

The following sections cover the methods of acquiring and displaying EDS Spectra.

• The EDX Spectrum Toolbar
• First Run
• Selecting Hardware Settings
• Preparing to Calibrate the Spectrum
• Manually Calibrating the EDX Spectrum
• Autocalibrating the EDX Spectrum
• Acquiring a Spectrum
• Saving and Opening Catalogs
• Saving and Opening Spectra
• Setting KLM Markers and ROIs
• Direct Screen Observation of Spectrum Data
• Spectrum Overlays
• Dot-Mapping

• The EDX Spectrum Toolbar
• First Run
• Set One-time Parameters
• Preparing to Calibrate the Spectrum
• Manually Calibrating the EDX Spectrum
• Autocalibrating the EDX Spectrum
• Acquiring a Spectrum
• Saving and Opening Catalogs
• Saving and Opening Spectra
• Setting KLM Markers
• Direct Screen Observation of Spectrum Data
• Spectrum Overlays

The following sections cover the methods of analyzing EDS Spectra.

• Quant Initialization
• Detector Parameters
• Analysis Parameters
• ZAF and Cliff-Lorimer
• Peak Identification
• Quant Analysis
• Making and Using Standards

• Quant Initialization
• Detector Parameters
• Analysis Parameters
• ZAF and Cliff-Lorimer
• Peak Identification
• Quant Analysis
• Making and Using Standards

The following sections cover the methods of acquiring and displaying EDS Images (x-ray maps).

• First Run
• Configuring the x-ray maps
• Configuring the color phase map
• Configuring the SEM image
• Acquiring the Maps
• Dwell Time Operating Note

• The EDX Image Toolbar
• First Run - Initial Configuration
• Acquiring the Maps
• Extracting Spectra
• Dwell Time Operating Note
• Fast Mapping Operating Note

The following sections cover the methods of acquiring and displaying TEM images

• The TEM Image Toolbar
• Previewing Images
• First Run
• Selecting Preview Resolution
• Adjusting Brightness and Exposure Time
• Acquiring and Saving Images
• Flat Field Corrections

The following section covers use of the new integrated interface, including all modes listed above.

• The Universal Toolbar
• First Run - Initial Configuration
  • Setup for Survey Images
  • Setup for Capture Images
  • Setup for EDX Hyperspectral Imaging
  • Setup for EDX Probes
  • Setup for EDX Linescans
  • Other Settings

• Acquisition and Display
  • Survey Images
  • Capture Images
    • EDX Point Probes
    • EDX Linescans
    • EDX Selected Areas

  • EDX Hyperspectral Images

The following section covers use of Revolution's Image Tools interface, for histogramming, image filtering, particle analysis, and acquisition reinjection.

• Image Tools and Histograms
• Applying Filters
• Building Masks via Segmentation
• Mask Tools
• Dwell Masks

The following sections cover various configurations whose
scope is outside of the normal manual pages.
Each section has its own PDF download.